Analog and Mixed-Signal...

Frontiers in Electronic Testing (Series)

Book 16

Adam Osseiran Editor
(2013)

High Performance Memory...

Frontiers in Electronic Testing (Series)

Delay Fault Testing for VLSI...

Frontiers in Electronic Testing (Series)

Book 14

Angela Krstic Author
Kwang-Ting (Tim) Cheng Author
(2012)

Reasoning in Boolean Networks

Frontiers in Electronic Testing (Series)

Book 9

Wolfgang Kunz Author
Dominik Stoffel Author
(2013)

Soft Errors in Modern...

Frontiers in Electronic Testing (Series)

Book 41

Michael Nicolaidis Editor
(2010)

Timing Performance of...

Frontiers in Electronic Testing (Series)

Book 39

Victor Champac Author
Jose Garcia Gervacio Author
(2018)

Defect-Oriented Testing for...

Frontiers in Electronic Testing (Series)

Book 34

Manoj Sachdev Author
José Pineda de Gyvez Author
(2007)

Digital Timing Measurements

Frontiers in Electronic Testing (Series)

Book 33

Wolfgang Maichen Author
(2006)

Emerging Nanotechnologies

Frontiers in Electronic Testing (Series)

Book 37

Mohammad Tehranipoor Editor
(2007)

Fault-Tolerance Techniques...

Frontiers in Electronic Testing (Series)

Book 32

Fernanda Lima Kastensmidt Author
Ricardo Reis Author
(2007)

New Methods of Concurrent...

Frontiers in Electronic Testing (Series)

Book 42

Michael Gössel Author
Vitaly Ocheretny Author
(2008)

Oscillation-Based Test in...

Frontiers in Electronic Testing (Series)

Book 36

Gloria Huertas Sánchez Author
Diego Vázquez García de la Vega Author
(2007)

The Core Test Wrapper Handbook

Frontiers in Electronic Testing (Series)

Book 35

Francisco da Silva Author
Teresa McLaurin Author
(2006)