Analog and Mixed-Signal...

Frontiers in Electronic Testing (Series)

Adam Osseiran Editor
(2013)

Oscillation-Based Test in...

Frontiers in Electronic Testing (Series)

Gloria Huertas Sánchez Author
Diego Vázquez García de la Vega Author
(2007)

New Methods of Concurrent...

Frontiers in Electronic Testing (Series)

Michael Gössel Author
Vitaly Ocheretny Author
(2008)

High Performance Memory...

Frontiers in Electronic Testing (Series)

Delay Fault Testing for VLSI...

Frontiers in Electronic Testing (Series)

Angela Krstic Author
Kwang-Ting (Tim) Cheng Author
(2012)

Reasoning in Boolean Networks

Frontiers in Electronic Testing (Series)

Wolfgang Kunz Author
Dominik Stoffel Author
(2013)

Soft Errors in Modern...

Frontiers in Electronic Testing (Series)

Michael Nicolaidis Editor
(2010)

Timing Performance of...

Frontiers in Electronic Testing (Series)

Victor Champac Author
Jose Garcia Gervacio Author
(2018)

Defect-Oriented Testing for...

Frontiers in Electronic Testing (Series)

Manoj Sachdev Author
José Pineda de Gyvez Author
(2007)

Digital Timing Measurements

Frontiers in Electronic Testing (Series)

Wolfgang Maichen Author
(2006)

Emerging Nanotechnologies

Frontiers in Electronic Testing (Series)

Mohammad Tehranipoor Editor
(2007)

Fault-Tolerance Techniques...

Frontiers in Electronic Testing (Series)

Fernanda Lima Kastensmidt Author
Ricardo Reis Author
(2007)

The Core Test Wrapper Handbook

Frontiers in Electronic Testing (Series)

Francisco da Silva Author
Teresa McLaurin Author
(2006)