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Patent Ethics: Prosecution, by David Hricik and Mercedes Meyer, is an essential guide to the ethical issues arising in the course of the patent prosecution process. By providing relevant rules and case law, it allows practitioners to identify ethical problems before they arise and to address them most effectively when they do. Patent Ethics: Prosecution is one of two volumes on patent ethics — the second focuses on litigation — and is the first of its kind to combine the United State Patent and Trademark Office (PTO) rules with commentary by the authors, which distills the authors' own experience and expertise in patent prosecution into effective practice strategies.
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"This is a book that includes specific guidance for both patent attorneys and patent agents. It should be within the reach of every patent prosecutor...I suspect that this book will quickly become the leading authority on patent prosecution ethics." —Patently-O
"Provides practical advice on best practices, along with exemplary language for use in written communications with clients and potential clients, and should be a welcome addition to the bookshelf of many patent prosecutors...A thorough, comprehensive, and up-to-date treatise on this important and timely topic." —The IP Law Book Review
"PATENT ETHICS does an excellent job of identifying the many potential "ethical" pitfalls confronting these practitioners, in a manner that is comprehensive, up-to-date and practical, filling an important niche that to my knowledge is not addressed in any other book." —The IP Law Book Review
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