Patent Ethics: Prosecution, by David Hricik and Mercedes Meyer, is an essential guide to the ethical issues arising in the course of the patent prosecution process. By providing relevant rules and case law, it allows practitioners to identify ethical problems before they arise and to address them most effectively when they do. Patent Ethics: Prosecution is one of two volumes on patent ethics -- the second focuses on litigation -- and is the first of its kind to combine the United State Patent and Trademark Office (PTO) rules with commentary by the authors, which distills the authors' own experience and expertise in patent prosecution into effective practice strategies. Features • A unique and well-organized tool for confronting practical ethical issues and conflicts of interest that increasingly arise in patent prosecution • Analyzes essential patent ethics rules and case law, as well as practice-oriented strategies and examples to assist practitioners who need to resolve "real-world" issues • Written by practitioner (Meyer) and scholar (Hricik) with many years of experience in patent prosecution